3D stochastic interferometer detects picometer deformations and minute dielectric fluctuations of its optical volume
Guillaume Graciani, Marcel Filoche, Francois Amblard

TL;DR
This paper introduces a 3D stochastic interferometer capable of detecting extremely minute deformations and dielectric fluctuations within an optical cavity, achieving picometer sensitivity over a broad frequency range using speckle pattern analysis.
Contribution
The work presents a novel interferometric method utilizing a high-finesse speckle cavity with photon autocorrelation to detect picometer-scale deformations and dielectric fluctuations across multiple frequency decades.
Findings
Detects cavity deformations at 2.7 pm resolution at 1 kHz.
Operates over 8-10 frequency decades below 100 MHz.
Enhances sensitivity to thermal motions by 100 times compared to traditional methods.
Abstract
Optical interferometry has proven extremely powerful to investigate some of the most fundamental laws of physics, using light with very precisely controlled geometry. In the past few decades, various speckle metrology methods have emerged to harness the interferometric properties of strongly disordered light instead, using time-domain analysis of speckle patterns at a maximum rate limited by the frequency of image acquisition. The present work is based on using a centimeter-sized quartz-powder cavity with an arbitrary shape that is engineered with very high Lambertian reflectivity. When filled with a coherent monochromatic photon gas, a statistically isotropic and homogeneous 3D speckle interference pattern is obtained. A single-mode fiber is then used in combination with photon number autocorrelation analysis to detect minute changes of the speckle decorrelation spectrum, caused either…
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Taxonomy
TopicsOptical Polarization and Ellipsometry · Random lasers and scattering media · Optical Imaging and Spectroscopy Techniques
