Directionally Decomposing Structured Light for Projector Calibration
Masatoki Sugimoto, Daisuke Iwai, Koki Ishida, Parinya Punpongsanon,, Kosuke Sato

TL;DR
This paper introduces a practical projector calibration method using structured light and pinhole masks, enabling accurate intrinsic parameter estimation regardless of focusing distance or aperture size, suitable for dynamic projection mapping.
Contribution
The proposed technique employs a novel device with pinhole masks and structured light to calibrate projectors without shallow depth-of-field limitations, using standard camera calibration methods.
Findings
Achieves calibration accuracy comparable to conventional methods.
Works effectively across various focusing distances and aperture sizes.
Suitable for dynamic projection mapping applications.
Abstract
Intrinsic projector calibration is essential in projection mapping (PM) applications, especially in dynamic PM. However, due to the shallow depth-of-field (DOF) of a projector, more work is needed to ensure accurate calibration. We aim to estimate the intrinsic parameters of a projector while avoiding the limitation of shallow DOF. As the core of our technique, we present a practical calibration device that requires a minimal working volume directly in front of the projector lens regardless of the projector's focusing distance and aperture size. The device consists of a flat-bed scanner and pinhole-array masks. For calibration, a projector projects a series of structured light patterns in the device. The pinholes directionally decompose the structured light, and only the projected rays that pass through the pinholes hit the scanner plane. For each pinhole, we extract a ray passing…
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Taxonomy
TopicsOptical measurement and interference techniques · Advanced Vision and Imaging · 3D Surveying and Cultural Heritage
