TL;DR
This paper introduces a defect prediction guided test generation method that allocates more testing resources to likely defective code parts, improving bug detection efficiency in automated Java testing.
Contribution
It integrates defect prediction into search-based testing, enhancing bug-finding effectiveness without increasing testing budget.
Findings
Increased bug detection in defect-prone code regions
Improved testing efficiency with defect-guided approach
Validated on Defects4J benchmark
Abstract
Today, most automated test generators, such as search-based software testing (SBST) techniques focus on achieving high code coverage. However, high code coverage is not sufficient to maximise the number of bugs found, especially when given a limited testing budget. In this paper, we propose an automated test generation technique that is also guided by the estimated degree of defectiveness of the source code. Parts of the code that are likely to be more defective receive more testing budget than the less defective parts. To measure the degree of defectiveness, we leverage Schwa, a notable defect prediction technique. We implement our approach into EvoSuite, a state of the art SBST tool for Java. Our experiments on the Defects4J benchmark demonstrate the improved efficiency of defect prediction guided test generation and confirm our hypothesis that spending more time budget on likely…
Peer Reviews
No public reviews on file for this paper yet. If you reviewed it on a platform where reviews are public (OpenReview, ICLR, NeurIPS, ICML), you can paste yours below so the community can read it here.
Code & Models
Videos
No videos yet. Explain this paper in a talk, walkthrough, or lecture? Add one.
