Characterizing random 1D media with an embedded reflector via scattered waves

TL;DR

This paper demonstrates that the mean free path, reflector strength, and position in a 1D random medium can be accurately determined using scattered wave measurements, with implications for characterizing complex media.

Contribution

It introduces a method to extract the mean free path, reflector strength, and position from scattering data, combining theory, experiments, and simulations.

Findings

Mean free path and reflector strength are inferred from transmission statistics.

Reflector position is determined from average dwell time measurements.

Transmission statistics are independent of reflector position.

Abstract

We show in random matrix theory, microwave measurements, and computer simulations that the mean free path of a random medium and the strength and position of an embedded reflector can be determined from radiation scattered by the system. The mean free path and strength of the reflector are determined from the statistics of transmission. The statistics of transmission are independent of the position of the reflector. The reflector's position can be found, however, from the average dwell time for waves incident from one side of the sample.