Unsupervised learning approaches to characterize heterogeneous samples using X-ray single particle imaging
Yulong Zhuang, Salah Awel, Anton Barty, Richard Bean, Johan Bielecki,, Martin Bergemann, Benedikt J. Daurer, Tomas Ekeberg, Armando D. Estillore,, Hans Fangohr, Klaus Giewekemeyer, Mark S. Hunter, Mikhail Karnevskiy, Richard, A. Kirian, Henry Kirkwood, Yoonhee Kim

TL;DR
This paper introduces two unsupervised methods, common-line PCA and VAEs, to classify and generate 3D structures from heterogeneous X-ray SPI data, addressing orientation and noise challenges.
Contribution
It presents novel orientation-aware classification and structure generation techniques for heterogeneous X-ray SPI data, enabling analysis of complex structural landscapes.
Findings
Successfully classified structural heterogeneity in experimental data
Generated 3D structures at various points in the structural landscape
Demonstrated robustness with low photon count datasets
Abstract
One of the outstanding analytical problems in X-ray single particle imaging (SPI) is the classification of structural heterogeneity, which is especially difficult given the low signal-to-noise ratios of individual patterns and that even identical objects can yield patterns that vary greatly when orientation is taken into consideration. We propose two methods which explicitly account for this orientation-induced variation and can robustly determine the structural landscape of a sample ensemble. The first, termed common-line principal component analysis (PCA) provides a rough classification which is essentially parameter-free and can be run automatically on any SPI dataset. The second method, utilizing variation auto-encoders (VAEs) can generate 3D structures of the objects at any point in the structural landscape. We implement both these methods in combination with the noise-tolerant…
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Taxonomy
TopicsAdvanced X-ray Imaging Techniques · Advanced Neuroimaging Techniques and Applications · X-ray Spectroscopy and Fluorescence Analysis
