CIM: Class-Irrelevant Mapping for Few-Shot Classification

TL;DR

This paper introduces CIM, a novel method for evaluating pre-trained feature extraction models in few-shot classification by using dictionary learning to generate class-irrelevant feature maps, along with a new accuracy metric.

Contribution

The paper proposes CIM, a flexible approach for model appraisal in FSC that does not rely on backpropagation, and introduces FLA as a new evaluation metric.

Findings

CIM outperforms CAM in regular tasks.

CIM effectively appraises FSC frameworks without classification results.

The method provides better visualization of feature relevance.

Abstract

Few-shot classification (FSC) is one of the most concerned hot issues in recent years. The general setting consists of two phases: (1) Pre-train a feature extraction model (FEM) with base data (has large amounts of labeled samples). (2) Use the FEM to extract the features of novel data (with few labeled samples and totally different categories from base data), then classify them with the to-be-designed classifier. The adaptability of pre-trained FEM to novel data determines the accuracy of novel features, thereby affecting the final classification performances. To this end, how to appraise the pre-trained FEM is the most crucial focus in the FSC community. It sounds like traditional Class Activate Mapping (CAM) based methods can achieve this by overlaying weighted feature maps. However, due to the particularity of FSC (e.g., there is no backpropagation when using the pre-trained FEM to extract novel features), we cannot activate the feature map with the novel classes. To address this challenge, we propose a simple, flexible method, dubbed as Class-Irrelevant Mapping (CIM). Specifically, first, we introduce dictionary learning theory and view the channels of the feature map as the bases in a dictionary. Then we utilize the feature map to fit the feature vector of an image to achieve the corresponding channel weights. Finally, we overlap the weighted feature map for visualization to appraise the ability of pre-trained FEM on novel data. For fair use of CIM in evaluating different models, we propose a new measurement index, called Feature Localization Accuracy (FLA). In experiments, we first compare our CIM with CAM in regular tasks and achieve outstanding performances. Next, we use our CIM to appraise several classical FSC frameworks without considering the classification results and discuss them.