Force Detection of Electromagnetic Beam Chirality at the Nanoscale
Abid Anjum Sifat, Filippo Capolino, Eric O. Potma

TL;DR
This paper proposes a theoretical method to measure the optical chirality of electromagnetic beams at the nanoscale by analyzing the force differences exerted on a sharp tip illuminated by beams of opposite handedness, enabling characterization beyond the diffraction limit.
Contribution
It introduces a force-based technique to quantify optical chirality at the nanoscale, linking force differences to helicity density and spin angular momentum, supported by simulations.
Findings
Force difference correlates with beam's helicity density.
Gradient force difference is proportional to optical helicity.
Method is within experimental detection range.
Abstract
Many nanophotonic applications require precise control and characterization of electromagnetic field properties at the nanoscale. The chiral properties of the field are among its key characteristics, yet measurement of optical chirality at dimensions beyond the diffraction limit has proven difficult. Here we theoretically show that the chiral properties of light can be characterized down to the nanometer scale by means of force detection. To measure the chiral properties of a beam of given handedness at the nanoscale, we determine the photo-induced force exerted on a sharp tip, which is illuminated first by the beam of interest and second by an auxiliary beam of opposite handedness, in a sequential manner. We show that the difference between the force measurements is directly proportional to the chiral properties of the beam of interest. In particular, the gradient force difference…
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Taxonomy
TopicsOrbital Angular Momentum in Optics · Mechanical and Optical Resonators · Force Microscopy Techniques and Applications
