Linear voltage recovery after a breakdown in a pulsed dc system
Anton Saressalo, Dan Wang, Flyura Djurabekova

TL;DR
This study investigates how linear voltage recovery after a breakdown in pulsed dc systems affects secondary breakdowns, finding that more pulses and controlled ramping reduce breakdown rates and localize secondary events.
Contribution
It introduces an optimized linear voltage recovery method in pulsed dc systems to minimize secondary breakdowns and improve high-voltage device efficiency.
Findings
More pulses during recovery reduce secondary breakdowns.
Steeper voltage ramps localize secondary breakdowns near the end.
Peak breakdown probability occurs around 1 second after ramping, decreasing exponentially with energy input.
Abstract
Breakdowns may occur in high-voltage applications even in ultrahigh vacuum conditions. Previously, we showed that it is important to pay attention to the post-breakdown voltage recovery in order to limit the appearance of secondary breakdowns associated with the primary ones. This can improve the overall efficiency of the high-voltage device. In this study, we focus on the optimization of the linear post-breakdown voltage recovery, with the principle aim of alleviating the problem of the secondary breakdowns. We investigate voltage recovery scenarios with different starting voltages and slopes of linear voltage increase by using a pulsed dc system. We find that a higher number of pulses during the voltage recovery produces fewer secondary BDs and a lower overall breakdown rate. Lowering the number of pulses led to more dramatic voltage recovery resulting in higher breakdown rates. A…
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