Simulation of Scanning Near-Field Optical Microscopy Spectra of 1D Plasmonic Graphene Junctions

TL;DR

This paper uses numerical simulations to analyze s-SNOM spectra of 1D plasmonic graphene junctions, revealing conditions where traditional interpretation methods fail and enhancing understanding of local transport in 2D materials.

Contribution

It provides a detailed simulation framework and analysis for s-SNOM spectra of graphene junctions, highlighting limitations of conventional interpretation methods.

Findings

Identification of conditions where conventional plasmon reflection interpretation fails

Application of results to other conducting 2D materials

Enhanced understanding of local transport properties in 2D materials

Abstract

We present numerical simulations of scattering-type Scanning Near-Field Optical Microscopy (s-SNOM) of 1D plasmonic graphene junctions. A comprehensive analysis of simulated s-SNOM spectra is performed for three types of junctions. We find conditions when the conventional interpretation of the plasmon reflection coefficients from s-SNOM measurements does not apply. Our results are applicable to other conducting 2D materials and provide a comprehensive understanding of the s-SNOM techniques for probing local transport properties of 2D materials.