Strain and crystal field splitting inversion in III-Nitrides
F\'abio D. Bonani, Anderson H. Siqueira, Hor\'acio W. Leite Alves and, Guilherme M. Sipahi

TL;DR
This study uses advanced computational methods to analyze the elastic and electronic properties of III-Nitrides, revealing an inversion of crystal field splitting linked to internal strain, impacting doping strategies.
Contribution
It provides a comprehensive comparison of AlN, GaN, and InN properties and introduces a model connecting strain to crystal-field splitting in these materials.
Findings
Inversion of top valence band linked to negative crystal field splitting.
Elastic constants and Young's modulus are determined for all three compounds.
A model relates deformation energy to crystal-field splitting and internal strain.
Abstract
The wurtzite phase group III-Nitrides (AlN, GaN, InN) have attracted great interest due to their successful applications in the optoelectronics since the 90's. In this paper we perform a comprehensive study of AlN, GaN and InN structural elastic and electronic properties using hybrid and conventional Density Functional Theory, presenting a comparison of the features of the three compounds. We perform a direct comparison of the features of their electronic structures, including the inversion of the top valence band associated with a negative crystal field splitting and its relation to the challenges of acceptor-doping on AlN systems. With the determination of elastic constants and the Young modulus we provide a simple model to connect a deformation energy associated with the parameter and the effective crystal-field splitting, showing a direct relation among internal strain and the…
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Taxonomy
TopicsGaN-based semiconductor devices and materials · Acoustic Wave Resonator Technologies · Metal and Thin Film Mechanics
