Direct atomic layer deposition of ultrathin aluminium oxide on monolayer $MoS_2$ exfoliated on gold: the role of the substrate
Emanuela Schilir\`o, Raffaella Lo Nigro, Salvatore E. Panasci,, Simonpietro Agnello, Marco Cannas, Franco M. Gelardi, Fabrizio Roccaforte,, Filippo Giannazzo

TL;DR
This study demonstrates the successful direct atomic layer deposition of ultrathin aluminium oxide on monolayer MoS2 supported by gold, revealing substrate-induced effects on nucleation and film uniformity with implications for device fabrication.
Contribution
It introduces a novel method for high-quality ALD of Al2O3 on monolayer MoS2 using a gold substrate, highlighting the substrate's role in nucleation and film quality.
Findings
High-quality 3.6 nm Al2O3 films were grown on MoS2/Au at 250°C.
Nucleation was significantly improved on MoS2/Au compared to other substrates.
Gold substrate induces tensile strain and p-doping, enhancing ALD nucleation.
Abstract
In this paper we demonstrated the thermal Atomic Layer Deposition (ALD) growth at 250 {\deg}C of highly homogeneous and ultra-thin ( 3.6 nm) films with excellent insulating properties directly onto a monolayer (1L) membrane exfoliated on gold. Differently than in the case of 1L supported by a common insulating substrate (), a better nucleation process of the high-k film was observed on the 1L system since the ALD early stages. Atomic force microscopy analyses showed a surface coverage just after 10 ALD cycles, its increasing up to (after 40 cycles), and an uniform 3.6 nm film, after 80 cycles. The coverage percentage was found to be significantly reduced in the case of 2L , indicating a crucial role of the interfacial interaction between the aluminum precursor and …
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Taxonomy
Topics2D Materials and Applications · Semiconductor materials and devices · ZnO doping and properties
