Measurement of the Low-temperature Loss Tangent of High-resistivity Silicon with a High Q-factor Superconducting Resonator
Mattia Checchin, Daniil Frolov, Andrei Lunin, Anna Grassellino,, Alexander Romanenko

TL;DR
This study measures the loss tangent of high-resistivity silicon at millikelvin temperatures using a superconducting resonator, revealing non-monotonic temperature dependence and field effects relevant for quantum device coherence.
Contribution
It introduces a high-precision measurement technique for loss tangent in insulating materials at cryogenic temperatures, with a phenomenological model explaining the observed behavior.
Findings
Loss tangent values at millikelvin temperatures are quantified.
Non-monotonic temperature dependence of loss tangent is observed.
Loss increases with electric field, explained by variable range hopping.
Abstract
In this letter, we present the direct loss tangent measurement of a high-resistivity intrinsic (100) silicon wafer in the temperature range from ~ 70 mK to 1 K, approaching the quantum regime. The measurement was performed using a technique that takes advantage of a high quality factor superconducting niobium resonator and allows to directly measure the loss tangent of insulating materials with high level of accuracy and precision. We report silicon loss tangent values at the lowest temperature and for electric field amplitudes comparable to those found in planar transmon devices one order of magnitude larger than what was previously estimated. In addition, we discover a non-monotonic trend of the loss tangent as a function of temperature that we describe by means of a phenomenological model based on variable range hopping conduction between localized states around the Fermi energy. We…
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Taxonomy
TopicsPhysics of Superconductivity and Magnetism · Quantum and electron transport phenomena · Surface and Thin Film Phenomena
