Confirmation of Transit-Time Limited Field Emission in Advanced Carbon Materials with Fast Pattern Recognition Algorithm
Taha Y. Posos, Oksana Chubenko, Sergey V. Baryshev

TL;DR
This paper introduces a fast pattern recognition algorithm to accurately estimate the field emission area from micrographs, enabling better analysis of electron emission in advanced carbon materials and confirming transit-time limited behavior.
Contribution
A novel, easy-to-use pattern recognition algorithm is developed to analyze electron emission micrographs, providing quantitative emission area estimation and current density analysis in vacuum electronics.
Findings
Demonstrated the algorithm's effectiveness on ultrananocrystalline diamond and carbon nanotube fibers.
Confirmed current density saturation behavior inconsistent with traditional theories.
Showed transit-time limited charge resupply explains observed saturation.
Abstract
An accurate estimation of the experimental field-emission area remains a great challenge in vacuum electronics. The lack of convenient means, which can be used to measure this parameter, creates a critical knowledge gap, making it impossible to compare theory to experiment. In this work, a fast pattern recognition algorithm was developed to complement a field emission microscopy, together creating a methodology to obtain and analyze electron emission micrographs in order to quantitatively estimate the field emission area. The algorithm is easy to use and made available to the community as a freeware, and therefore is described in detail. Three examples of dc emission are given to demonstrate the applicability of this algorithm to determine spatial distribution of emitters, calculate emission area, and finally obtain experimental current density as a function of the electric field for…
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