Fabrication and surface treatment of electron-beam evaporated niobium for low-loss coplanar waveguide resonators
D. Kowsari, K. Zheng, J. T. Monroe, N. J. Thobaben, X. Du, P. M., Harrington, E. A. Henriksen, D. S. Wisbey, and K. W. Murch

TL;DR
This study demonstrates that ultra-high vacuum electron-beam evaporated niobium films can achieve very low microwave loss and high quality factors in coplanar waveguide resonators, suitable for quantum applications.
Contribution
It introduces a fabrication process yielding low-loss niobium films with high superconducting transition temperature and minimal two-level-system loss for quantum microwave devices.
Findings
Superconducting transition temperature of 9.20 K.
Two-level-system loss tangent as low as 1.5 x 10^-7.
Internal quality factors exceeding one million in single-photon regime.
Abstract
We characterize low-loss electron-beam evaporated niobium thin films deposited under ultra-high vacuum conditions. Slow deposition yields films with a high superconducting transition temperature () as well as a residual resistivity ratio of . We fabricate the films into coplanar waveguide resonators to extract the intrinsic loss due to the presence of two-level-system fluctuators using microwave measurements. For a coplanar waveguide resonator gap of , the films exhibit filling-factor-adjusted two-level-system loss tangents as low as with single-photon regime internal quality factors in excess of one million after removing native surface oxides of the niobium.
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