Detecting Carbon Nanotube Orientation with Topological Data Analysis of Scanning Electron Micrographs
Liyu Dong, Haibin Hang, Jin Gyu Park, Washington Mio, Richard Liang

TL;DR
This paper introduces a novel topological data analysis method to quantify carbon nanotube orientation in SEM images, providing a rapid, robust, and accurate tool for assessing CNT alignment crucial for aerospace material development.
Contribution
The study develops a new TDA-based approach to detect CNT orientation from SEM images, validated against established techniques with high accuracy and robustness.
Findings
High correlation (R^2=0.975) with polarized Raman and X-ray scattering.
Method remains robust across different SEM settings.
Provides a quick, simple quantification of CNT alignment.
Abstract
As the aerospace industry becomes increasingly demanding for stronger lightweight materials, the ultra-strong carbon nanotube (CNT) composites with highly aligned CNT network structures could be the answer. In this work, a novel methodology applying topological data analysis (TDA) to the scanning electron microscope (SEM) images was developed to detect CNT orientation. The CNT bundle extensions in certain directions were summarized algebraically and expressed as visible barcodes. The barcodes were then calculated and converted into the total spread function , from which the alignment fraction and the preferred direction could be determined. For validation purposes, the random CNT sheets were mechanically stretched at various strain ratios ranging from , and quantitative TDA analysis was conducted based on the SEM images taken at random positions. The results showed…
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Taxonomy
TopicsTopological and Geometric Data Analysis · Cell Image Analysis Techniques · Advanced Fluorescence Microscopy Techniques
