TL;DR
This study uses advanced microscopy to analyze the spatial and temporal variations of moiré patterns in twisted bilayer graphene, revealing minimal variation, thermal fluctuations, and the presence of topological defects, which impact local electronic properties.
Contribution
We provide detailed spatial and temporal analysis of moiré patterns in TBG, demonstrating reduced variation, thermal fluctuation behavior, and identifying edge dislocations that influence electronic properties.
Findings
Lower spatial variation than previously reported
Thermal fluctuations cause collective atomic displacements under 70pm
Presence of edge dislocations affecting local electronic properties
Abstract
In twisted bilayer graphene (TBG) a moir\'e pattern forms that introduces a new length scale to the material. At the 'magic' twist angle of 1.1{\deg}, this causes a flat band to form, yielding emergent properties such as correlated insulator behavior and superconductivity [1-4]. In general, the moir\'e structure in TBG varies spatially, influencing the local electronic properties [5-9] and hence the outcome of macroscopic charge transport experiments. In particular, to understand the wide variety observed in the phase diagrams and critical temperatures, a more detailed understanding of the local moir\'e variation is needed [10]. Here, we study spatial and temporal variations of the moir\'e pattern in TBG using aberration-corrected Low Energy Electron Microscopy (AC-LEEM) [11,12]. The spatial variation we find is lower than reported previously. At 500{\deg}C, we observe thermal…
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