Towards Automating Structural Discovery in Scanning Transmission Electron Microscopy
Nicole Creange, Ondrej Dyck, Rama K. Vasudevan, Maxim Ziatdinov,, Sergei V. Kalinin

TL;DR
This paper develops and compares automated workflows using active learning and deep learning techniques to improve structural discovery in scanning transmission electron microscopy, addressing the challenge of selecting relevant regions efficiently.
Contribution
It introduces multiple automated experiment workflows that incorporate Bayesian optimization, deep learning, and variational autoencoders to enhance structural discovery in STEM imaging.
Findings
Demonstrates tradeoffs between accuracy and robustness of different workflows.
Shows effectiveness of deep learning descriptors and autoencoders in identifying features.
Provides open-source code for reproducibility and further research.
Abstract
Scanning transmission electron microscopy (STEM) is now the primary tool for exploring functional materials on the atomic level. Often, features of interest are highly localized in specific regions in the material, such as ferroelectric domain walls, extended defects, or second phase inclusions. Selecting regions to image for structural and chemical discovery via atomically resolved imaging has traditionally proceeded via human operators making semi-informed judgements on sampling locations and parameters. Recent efforts at automation for structural and physical discovery have pointed towards the use of "active learning" methods that utilize Bayesian optimization with surrogate models to quickly find relevant regions of interest. Yet despite the potential importance of this direction, there is a general lack of certainty in selecting relevant control algorithms and how to balance a…
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