An epsilon-near-zero-based Dallenbach absorber

TL;DR

This paper provides a theoretical analysis of total absorption conditions in Dallenbach absorbers, focusing on epsilon-near-zero materials like indium-tin oxide, and derives simple relations for achieving complete absorption.

Contribution

It introduces analytical relations for total absorption in ENZ-based Dallenbach absorbers and explores the angular limitations due to total external reflection.

Findings

Analytical conditions for total absorption in ENZ coatings.

Limited angular range for strong absorption due to total external reflection.

Application to indium-tin oxide as an example ENZ material.

Abstract

We report a theoretical analysis of total absorption conditions in a structure consisting of a lossy coating layer on top of a specular metal substrate, which is known as a Dallenbach absorber. All possible combinations of complex refractive indices of the coating material and thicknesses of the coating layer providing complete absorption are described for the case of normal incidence of a plane wave. The work of coatings based on epsilon-near-zero (ENZ) materials is analyzed in detail. Simple analytical relations are obtained for the conditions of total absorption. It is shown that the range of angles where strong absorption occurs is limited by the phenomenon of total external reflection. The characteristics of coatings based on indium-tin oxide, which is an example of an ENZ material, are analyzed.