Defect detection and NDE of low-modulus PMMA material using mechanical loading and WFT analysis
Jitendra Dhanotia, Amit Chatterjee, Vimal Bhatia, and Shashi Prakash

TL;DR
This paper demonstrates a method combining phase measuring deflectometry and WFT analysis for defect detection and non-destructive evaluation of low-modulus PMMA materials, showing promising experimental results.
Contribution
It introduces a novel approach integrating phase deflectometry with WFT for defect detection in low-modulus polymers, validated through experiments.
Findings
Effective detection of surface defects in PMMA using phase slope analysis.
WFT analysis enhances defect localization accuracy.
Experimental results confirm the method's viability.
Abstract
In present communication, we report our investigations undertaken towards detection of defects and non-destructive evaluation of low-modulus sample of Poly Methyl Metha Acrylate (PMMA) material using phase measuring deflectometry and windowed Fourier transform (WFT). The slope of the phase provides the information regarding defects and surface variation of the object. Experimental results conclusively establish the viability of the technique.
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Taxonomy
TopicsOptical measurement and interference techniques · Advanced Fiber Optic Sensors · Surface Roughness and Optical Measurements
