Influence of local surface defects on the minority-carrier lifetime of passivating-contact solar cells
Jean Cattin, Jan Haschke, Christophe Ballif, Matthieu Boccard

TL;DR
This study investigates how local surface defects impact the minority-carrier lifetime and overall efficiency of passivating-contact solar cells, revealing that defects can cause significant performance drops post-electrode deposition.
Contribution
The paper demonstrates that localized surface defects can significantly reduce device efficiency and lifetime after metallization, challenging the assumption that pre-metallization lifetime measurements are fully representative.
Findings
Localized defects can cause several percent efficiency loss.
Defects affect lifetime measurements after electrode deposition.
Defects can influence well-passivated areas remotely through electrical connection.
Abstract
Unlocking the full potential of passivating contacts, increasingly popular in the silicon solar cell industry, requires determining the minority carrier lifetime. Minor passivation drops limit the functioning of solar cells, however, they are not detected in devices with open-circuit voltages below 700 mV. In this work, simulations and experiments were used to show the effect of localized surface defects on the overall device performance. Although the defects did not significantly affect lifetime measurements prior to electrode deposition or open-circuit voltage measurements at standard-test conditions, it had a significant impact on the point of operation and, in turn, device efficiency (up to several percent efficiency drop). Furthermore, this study demonstrates that localized defects can have a detrimental effect on well-passivated areas located several centimeters away through…
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