Test-Time Adaptation to Distribution Shift by Confidence Maximization and Input Transformation
Chaithanya Kumar Mummadi, Robin Hutmacher, Kilian Rambach, Evgeny, Levinkov, Thomas Brox, Jan Hendrik Metzen

TL;DR
This paper introduces a novel test-time adaptation method that enhances neural network robustness to distribution shifts by combining confidence maximization, input transformation, and diversity regularization, without requiring labeled data.
Contribution
It proposes a new loss function and an input transformation module that together improve adaptation to distribution shifts in a fully test-time setting, outperforming previous methods.
Findings
Outperforms previous methods on ImageNet-C benchmark
Effectively improves robustness to common corruptions
Learns input transformations without target labels
Abstract
Deep neural networks often exhibit poor performance on data that is unlikely under the train-time data distribution, for instance data affected by corruptions. Previous works demonstrate that test-time adaptation to data shift, for instance using entropy minimization, effectively improves performance on such shifted distributions. This paper focuses on the fully test-time adaptation setting, where only unlabeled data from the target distribution is required. This allows adapting arbitrary pretrained networks. Specifically, we propose a novel loss that improves test-time adaptation by addressing both premature convergence and instability of entropy minimization. This is achieved by replacing the entropy by a non-saturating surrogate and adding a diversity regularizer based on batch-wise entropy maximization that prevents convergence to trivial collapsed solutions. Moreover, we propose to…
Peer Reviews
No public reviews on file for this paper yet. If you reviewed it on a platform where reviews are public (OpenReview, ICLR, NeurIPS, ICML), you can paste yours below so the community can read it here.
Videos
No videos yet. Explain this paper in a talk, walkthrough, or lecture? Add one.
Taxonomy
TopicsAnomaly Detection Techniques and Applications · Fault Detection and Control Systems · Sparse and Compressive Sensing Techniques
