Emergence of biased errors in imperfect photonic circuits

TL;DR

This paper investigates how experimental imperfections in integrated photonic circuits lead to biased errors, affecting high-precision tests and optical machine learning applications, and explores their correlation with optical path properties.

Contribution

It reveals the emergence of biased errors due to imperfections and analyzes their correlation with optical path characteristics, advancing understanding of error sources in photonic circuits.

Findings

Biased errors emerge from experimental imperfections.

Correlation between biased errors and optical path properties.

Implications for high-precision photonic applications.

Abstract

We study the impact of experimental imperfections in integrated photonic circuits. We discuss the emergence of a moderate biased error in path encoding, and investigate its correlation with properties of the optical paths. Our analysis connects and deepens previous studies in this direction, revealing potential issues for high-precision tests and optical implementations of machine learning.