Probing local density of states near the diffraction limit using nanowaveguide coupled cathode luminescence

TL;DR

This study introduces a novel nanowaveguide coupled cathode luminescence technique to measure how the photonic local density of states varies with device size and position, revealing non-trivial diffraction effects.

Contribution

The paper presents a new method for probing PLDOS in nanophotonic waveguides, demonstrating position-dependent diffraction limits and shape changes of PLDOS peaks.

Findings

PLDOS varies with position within the waveguide cross-section

Effective diffraction limit of PLDOS is position-dependent

PLDOS peak shape changes with device size and position

Abstract

The photonic local density of states (PLDOS) determines the light matter interaction strength in nanophotonic devices. For standard dielectric devices, the PLDOS is fundamentally limited by diffraction, but its precise dependence on the size parameter $s$ of a device can be non-trivial. Here, we measure the PLDOS dependence on the size parameter in a waveguide using a new technique - nanowaveguide coupled cathode luminescence (CL). We observe that depending on the position within the waveguide cross-section, the effective diffraction limit of the PLDOS varies, and the PLDOS peak shape changes. Our results are of fundamental importance for optimizing coupling to nanophotonic devices, and also open new avenues for spectroscopy based on evanescently coupled CL.