Probing charge dynamics in diamond with an individual color center
A. Gardill, I. Kemeny, M. C. Cambria, Y. Li, H. T. Dinani, A., Norambuena, J. R. Maze, V. Lordi, and S. Kolkowitz

TL;DR
This paper uses single-shot charge state readout of a nitrogen-vacancy center in diamond to investigate charge dynamics of defects, revealing how optical illumination influences charge states and providing insights for quantum device design.
Contribution
It introduces a novel method to probe charge dynamics in diamond using single-shot readout of NV centers, advancing understanding of defect charge states and their control.
Findings
NV charge state can be altered by holes from distant defects
Silicon-vacancy centers are likely in the SiV2- dark state under illumination
Charge transport and capture are crucial for quantum device performance
Abstract
Control over the charge states of color centers in solids is necessary in order to fully utilize them in quantum technologies. However, the microscopic charge dynamics of deep defects in wide-bandgap semiconductors are complex, and much remains unknown. Here, we utilize single shot charge state readout of an individual nitrogen-vacancy (NV) center to probe charge dynamics of the surrounding defects in diamond. We show that the NV center charge state can be converted through the capture of holes produced by optical illumination of defects many microns away. With this method, we study the optical charge conversion of silicon-vacancy (SiV) centers and provide evidence that the dark state of the SiV center under optical illumination is SiV2-. These measurements illustrate that charge carrier generation, transport, and capture are important considerations in the design and implementation of…
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