K-shell ionization cross sections of Cu, Zn and Ge by 3-5 MeV/U Si-ion bombardment

TL;DR

This study measures K-shell ionization cross sections of Cu, Zn, and Ge targets induced by 3-5 MeV/u Si ions, revealing discrepancies with theory that are partly explained by multiple ionization effects and electron capture.

Contribution

First experimental determination of K-shell ionization cross sections for these targets with Si ions in this energy range, including analysis of theoretical discrepancies.

Findings

Experimental cross sections are 28-35% of theoretical estimates.

Including multiple ionization effects reduces discrepancy to 51-56%.

Remaining differences may be due to electron capture.

Abstract

The K x-ray spectra of different targets (Cu, Zn, and Ge) induced by 3 to 5 MeV/u Si projectile ions have been measured to determine the K-shell ionization cross-section. A significant difference is observed between the measurements and theoretical estimates, where the theoretical ones are about 28-35% of the experimental results. Such difference is reduced to a good extent 51-56% if multiple ionization effects are taken into account. Remaining discrepancy may be attributed to the electron capture contribution.