Element-specific electronic and structural dynamics using transient X-ray spectroscopy
Hanzhe Liu, Isabel M. Klein, Jonathan M. Michelsen, Scott K. Cushing

TL;DR
Transient X-ray spectroscopy enables element-specific observation of ultrafast electronic and structural dynamics in materials, providing insights into photoinduced processes crucial for advancing solar energy and device technologies.
Contribution
This paper offers a comprehensive guide to implementing and interpreting transient X-ray experiments, emphasizing the use of extreme ultraviolet spectroscopy for layered material analysis.
Findings
Effective measurement of polaron formation and charge carrier kinetics.
Ability to distinguish dynamics in multilayer junctions.
Guidance on selecting optimal X-ray wavelengths and sources.
Abstract
Transient X-ray absorption techniques can measure ultrafast dynamics of the elemental edges in a material or multiple layer junction, giving them immense potential for deconvoluting concurrent processes. However, the interpretation of the photoexcited changes to an X-ray edge is not as simple as directly probing a transition with optical or infrared wavelengths. The core hole left by the core-level transition distorts the measured absorption and reflection spectra, both hiding and revealing different aspects of a photo-induced process. In this perspective, we describe the implementation and interpretation of transient X-ray experiments. This description includes a guide of how to choose the best wavelength and corresponding X-ray sources when designing an experiment. As an example, we focus on the rising use of extreme ultraviolet (XUV) spectroscopy for understanding performance…
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Taxonomy
TopicsX-ray Spectroscopy and Fluorescence Analysis · Ion-surface interactions and analysis · Advanced Chemical Physics Studies
