Josephson Junctions Via Anodization of Epitaxial Al on an InAs Heterostructure
A. Jouan, J. D. S. Witt, G. C. Gardner, C. Thomas, T. Lindemann, S., Gronin, M. J. Manfra, D. J. Reilly

TL;DR
This paper introduces a novel fabrication method for Josephson junctions using anodization of epitaxial aluminum on InAs heterostructures, which simplifies the process and produces high-quality junctions suitable for quantum computing applications.
Contribution
The paper presents a new anodization-based technique for defining Josephson junctions, avoiding wet-etching and enabling high-quality, selective oxidation in epitaxial Al-InAs heterostructures.
Findings
Observation of multiple Andreev reflections indicating high-quality junctions
Comparison showing differences in mobility and density between anodized and wet-etched Hall-bars
Potential for new fabrication approaches in junction-based qubit platforms
Abstract
We combine electron beam lithography and masked anodization of epitaxial aluminium to define tunnel junctions via selective oxidation, alleviating the need for wet-etch processing or direct deposition of dielectric materials. Applying this technique to define Josephson junctions in proximity induced superconducting Al-InAs heterostructures, we observe multiple Andreev reflections in transport experiments, indicative of a high quality junction. We further compare the mobility and density of Hall-bars defined via wet etching and anodization. These results may find utility in uncovering new fabrication approaches to junction-based qubit platforms.
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