Trimming Feature Extraction and Inference for MCU-based Edge NILM: a Systematic Approach
Enrico Tabanelli, Davide Brunelli, Andrea Acquaviva, Luca Benini

TL;DR
This paper presents a systematic approach to optimize feature extraction and inference for resource-constrained MCU-based NILM, achieving high accuracy with reduced computational and storage costs, enabling practical edge deployment.
Contribution
It introduces a method to trim feature spaces and optimize NILM algorithms for low-cost MCUs, maintaining high accuracy while significantly reducing resource usage.
Findings
Achieved 95.15% accuracy with optimized features on MCU
Up to 5.45x speed-up and 80.56% storage reduction
Near 80% accuracy using only current measurements
Abstract
Non-Intrusive Load Monitoring (NILM) enables the disaggregation of the global power consumption of multiple loads, taken from a single smart electrical meter, into appliance-level details. State-of-the-Art approaches are based on Machine Learning methods and exploit the fusion of time- and frequency-domain features from current and voltage sensors. Unfortunately, these methods are compute-demanding and memory-intensive. Therefore, running low-latency NILM on low-cost, resource-constrained MCU-based meters is currently an open challenge. This paper addresses the optimization of the feature spaces as well as the computational and storage cost reduction needed for executing State-of-the-Art (SoA) NILM algorithms on memory- and compute-limited MCUs. We compare four supervised learning techniques on different classification scenarios and characterize the overall NILM pipeline's…
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