Extremely low energy ARPES of quantum well states in cubic-GaN/AlN and GaAs/GaAlAs heterostructures
Mahdi Hajlaoui (1), Stefano Ponzoni (1), Michael Deppe (2), Tobias, Henksmeier (2), Donat Josef As (2), Dirk Reuter (2), Thomas Zentgraf (2),, Claus Michael Schneider (3, 4), Mirko Cinchetti (1) ((1) TU Dortmund, University, Department of Physics, Dortmund, Germany

TL;DR
This study demonstrates the use of extremely low energy ARPES to probe buried quantum well states in cubic-GaN/AlN heterostructures, revealing surface roughness effects and depth limitations for different materials.
Contribution
It introduces a novel application of low energy ARPES for accessing buried quantum well states in semiconductor heterostructures, highlighting its capabilities and limitations.
Findings
QW states in cubic-GaN/AlN can be observed but not their dispersion due to surface roughness.
QW states in GaAs/AlGaAs are too deep for detection by low energy ARPES.
Surface flatness influences the ability to detect and interpret ARPES spectra.
Abstract
Quantum well (QW) heterostructures have been extensively used for the realization of a wide range of optical and electronic devices. Exploiting their potential for further improvement and development requires a fundamental understanding of their electronic structure. So far, the most commonly used experimental techniques for this purpose have been all-optical spectroscopy methods that, however, are generally averaged in momentum space. Additional information can be gained by angle-resolved photoelectron spectroscopy (ARPES), which measures the electronic structure with momentum resolution. Here we report on the use of extremely low energy ARPES (photon energy 7 eV) to increase its depth sensitivity and access buried QW states, located at 3 nm and 6 nm below the surface of cubic-GaN/AlN and GaAs/AlGaAs heterostructures, respectively. We find that the QW states in cubic-GaN/AlN can…
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Taxonomy
TopicsSemiconductor materials and devices · Semiconductor Quantum Structures and Devices · Advancements in Semiconductor Devices and Circuit Design
