The modular Atom Probe Concept

TL;DR

This paper introduces a modular atom probe instrument that attaches directly to a dual beam SEM, enabling faster sample transfer, improved operational modes, and optimized handling of cryo-samples, with demonstrated performance improvements.

Contribution

It presents a new modular atom probe design integrated with a dual beam SEM, enhancing transfer speed, operational flexibility, and cryo-sample handling capabilities.

Findings

Enhanced mass resolution demonstrated

Improved detection efficiency achieved

Successful application examples provided

Abstract

Atomic probe tomography (APT), based on the work of Erwin Mueller, is able to generate three-dimensional chemical maps in atomic resolution. The required instruments for APT have evolved over the last 20 years from an experimental to an established method of materials analysis. Here, we describe the realization of a new instrument concept that allows the direct attachment of APT to a dual beam SEM microscope with the main achievement of fast and direct sample transfer. New operational modes are enabled regarding sample geometry, alignment of tips and microelectrode. The instrument is optimized to handle cryo-samples at all stages of preparation and storage. The instrument comes with its own software for evaluation and reconstruction. The performance in terms of mass resolution, aperture angle, and detection efficiency is demonstrated with a few application examples.