Nanoscale Non-Destructive Ferroelectric Characterization with Non-Contact Heterodyne Electrostrain Force Microscopy
Qibin Zeng, Qicheng Huang, Hongli Wang, Caiwen Li, Zhen Fan, Deyang, Chen, Yuan Cheng, Kaiyang Zeng

TL;DR
This paper introduces NC-HEsFM, a novel non-contact, non-destructive ferroelectric characterization technique that overcomes limitations of PFM, enabling high-resolution domain mapping, hysteresis measurement, and domain control in various environments.
Contribution
The paper presents NC-HEsFM, a new heterodyne electrostrain force microscopy method that allows for high-resolution, non-contact ferroelectric analysis using quartz tuning fork sensors.
Findings
Achieves real non-contact ferroelectric characterization with negligible electrostatic effects.
Enables high-resolution ferroelectric domain mapping and hysteresis measurement.
Compatible with high-vacuum and low-temperature environments.
Abstract
Perceiving nanoscale ferroelectric phenomena from real space is of great importance for elucidating underlying ferroelectric physics. During the past decades, nanoscale ferroelectric characterization has mainly relied on the Piezoresponse Force Microscopy (PFM), however, the fundamental limitations of PFM have made the nanoscale ferroelectric studies encounter significant bottlenecks. In this study, a high-resolution non-contact ferroelectric measurement, named Non-Contact Heterodyne Electrostrain Force Microscopy (NC-HEsFM), has been introduced firstly. It has been unambiguously demonstrated that NC-HEsFM can operate on multiple eigenmodes to perform ideal high-resolution ferroelectric domain mapping, standard ferroelectric hysteresis loop measurement and controllable domain manipulation. With using quartz tuning fork (QTF) sensor and heterodyne detection, NC-HEsFM shows an…
Peer Reviews
No public reviews on file for this paper yet. If you reviewed it on a platform where reviews are public (OpenReview, ICLR, NeurIPS, ICML), you can paste yours below so the community can read it here.
Videos
No videos yet. Explain this paper in a talk, walkthrough, or lecture? Add one.
Taxonomy
TopicsForce Microscopy Techniques and Applications · Ferroelectric and Piezoelectric Materials · Acoustic Wave Resonator Technologies
