Time-of-Flight Photoelectron Momentum Microscopy at 100-500 MHz Synchrotron Sources: Electron-Optical Chopping or Bandwidth Pre-Selection
G. Schoenhense, K. Medjanik, O. Fedchenko, A. Zymakova, S. Chernov, D., Vasilyev, S. Babenkov, H. J. Elmers, P. Baumg\"artel, P. Goslawski, G., Oehrwall, M. Ellguth, and A. Oelsner

TL;DR
This paper introduces two techniques for efficient time-of-flight electron spectroscopy at high-repetition-rate synchrotron sources, enabling high-resolution momentum microscopy despite small time gaps.
Contribution
It presents a fast electron-optical beam blanking method and compares it with energy pre-selection, advancing ToF spectroscopy at 100-500MHz sources.
Findings
Aberration-free momentum distributions at 5MHz and 1.25MHz pulse periods.
Effective ToF spectroscopy with few-meV resolution at high repetition rates.
Benchmarking of chopping versus dispersive element approaches.
Abstract
The small time gap of synchrotron radiation in conventional multi-bunch mode (100-500MHz) is prohibitive for time-of-flight (ToF) based electron spectroscopy. Even the new generation of delay-line detectors with improved time resolution (<100ps) yields only 20-100 resolved time slices within a 2-10ns gap. Here we present two techniques of implementing efficient ToF recording at sources with high repetition rate. A fast electron-optical beam blanking unit with GHz bandwidth, integrated in a photoelectron momentum microscope, allows chopping the photon-pulse train to any desired repetition period. Aberration-free momentum distributions have been recorded at chopped pulse periods of 5MHz (at MAX II) and 1.25MHz (at BESSY II). The approach is benchmarked against the alternative way of implementing a dispersive element, e.g. a hemispherical analyzer, in the electron optics. Both approaches,…
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Taxonomy
TopicsElectron and X-Ray Spectroscopy Techniques · Advanced Electron Microscopy Techniques and Applications · Photocathodes and Microchannel Plates
