Local inhomogeneities resolved by scanning probe techniques and their impact on local 2DEG formation in oxide heterostructures

TL;DR

This study uses advanced scanning probe techniques to investigate how local surface inhomogeneities at oxide interfaces influence the formation and properties of 2DEGs, linking microscopic structure to macroscopic electronic behavior.

Contribution

It demonstrates that LC-AFM and s-SNOM can non-destructively map local 2DEG formation and relate it to interface chemistry and surface termination in oxide heterostructures.

Findings

Local conductivity varies with interface stacking order.

Surface termination affects 2DEG formation and resistance.

Scanning probe techniques effectively link microscopic and macroscopic properties.

Abstract

Lateral inhomogeneities in the formation of 2-dimensional electron gases (2DEG) directly influence their electronic properties. Understanding their origin is an important factor for fundamental interpretations, as well as high quality devices. Here, we studied the local formation of the buried 2DEG at LaAlO3/SrTiO3 (LAO/STO) interfaces grown on STO (100) single crystals with partial TiO2 termination, utilizing in-situ local conductivity atomic force microscopy (LC-AFM) and scattering-type scanning near-field optical microscopy (s-SNOM). Using substrates with different degrees of chemical surface termination, we can link the resulting interface chemistry to an inhomogeneous 2DEG formation. In conductivity maps recorded by LC-AFM, a significant lack of conductivity is observed at topographic features, indicative of a local SrO/AlO2 interface stacking order, while significant local conductivity can be probed in regions showing TiO2/LaO interface stacking order. These results could be corroborated by s SNOM, showing a similar contrast distribution in the optical signal which can be linked to the local electronic properties of the material. The results are further complimented by low-temperature conductivity measurements, which show an increasing residual resistance at 5 K with increasing portion of insulating SrO terminated areas. Therefore, we can correlate the macroscopic electrical behavior of our samples to its nanoscopic structure. Using proper parameters, 2DEG mapping can be carried out without any visible alteration of sample properties, proving LC AFM and s SNOM to be viable and destruction-free techniques for the identification of local 2DEG formation. Furthermore, applying LC AFM and s SNOM in this manner opens the exciting prospect to link macroscopic low temperature transport to its nanoscopic origin.