Atomically sharp interface enabled ultrahigh-speed, nonvolatile memory devices
Liangmei Wu, AiWei Wang, Jinan Shi, Jiahao Yan, Zhang Zhou, Ce Bian,, Jiajun Ma, Ruisong Ma, Hongtao Liu, Jiancui Chen, Yuan Huang, Wu Zhou, Lihong, Bao, Min Ouyang, Stephen J. Pennycook, Sokrates T. Pantelides, Hong-Jun Gao

TL;DR
This paper reports the development of nonvolatile memory devices with atomically sharp interfaces that achieve ultrahigh-speed programming and erasing in nanoseconds, significantly surpassing traditional memory performance limits.
Contribution
Introduction of van der Waals heterostructure-based nonvolatile memory with atomically sharp interfaces enabling ultrahigh-speed operation near theoretical limits.
Findings
Programming/erasing in nanoseconds
Extinction ratio up to 10^10
Supports multi-bit storage
Abstract
Development of memory devices with ultimate performance has played a key role in innovation of modern electronics. As a mainstream technology nonvolatile memory devices have manifested high capacity and mechanical reliability, however current major bottlenecks include low extinction ratio and slow operational speed. Although substantial effort has been employed to improve their performance, a typical hundreds of micro- or even milli- second write time remains a few orders of magnitude longer than their volatile counterparts. We have demonstrated nonvolatile, floating-gate memory devices based on van der Waals heterostructures with atomically sharp interfaces between different functional elements, and achieved ultrahigh-speed programming/erasing operations verging on an ultimate theoretical limit of nanoseconds with extinction ratio up to 10^10. This extraordinary performance has allowed…
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