The DAQ and control system for JadePix3

TL;DR

This paper presents a DAQ and control system for the JadePix3 CMOS pixel sensor, enabling comprehensive testing of its functions and performance for the CEPC vertex detector.

Contribution

It introduces a scalable, robust, and portable test system based on IPbus with enhanced data transfer features for JadePix3 testing.

Findings

System successfully tested with pulse, cosmic, and laser tests.

Achieved extended block read/write speeds to meet JadePix3 specifications.

First comprehensive testing results of JadePix3 sensor are summarized.

Abstract

The silicon pixel sensor is the core component of the vertex detector for the Circular Electron Positron Collider~(CEPC). The JadePix3 is a full-function large-size CMOS chip designed for the CEPC vertex detector. To test all the functions and the performance of this chip, we designed a test system based on the IPbus framework. The test system controls the parameters and monitors the status of the pixel chip. By integrating the jumbo frame feature into the IPbus suite, the block read/write speed is further extended in order to meet the specifications of the JadePix3. The robustness, scalability, and portability of this system have been verified by pulse test, cosmic test and laser test in the laboratory. This paper summarizes the DAQ and control system of the JadePix3 and presents the first results of the tests.