About two-dimensional fits for the analysis of the scattering rates and renormalization functions from angle-resolved photoelectron spectroscopy data

TL;DR

This paper introduces a new ARPES data analysis method that accounts for instrumental and temperature effects, providing more accurate scattering rates and renormalization functions, especially useful for strongly correlated electron systems.

Contribution

The paper presents a novel analysis technique for ARPES data that improves accuracy by considering experimental resolution and temperature effects, advancing the study of quantum materials.

Findings

More accurate scattering rates obtained

Method effectively accounts for instrumental resolution

Demonstrated usefulness in strongly correlated systems

Abstract

A new method for the analysis of the scattering rates from angle-resolved photoelectron spectroscopy (ARPES) is presented and described in details. It takes into account experimental instrumental resolution and finite temperature effects. More accurate results are obtained in comparison with a standard, commonly used method. The application of the method is demonstrated for several examples commonly encountered in new quantum materials. Its usefulness is especially apparent in investigations of systems with strongly correlated electrons.