Fast digital refocusing and depth of field extended Fourier ptychography microscopy
G. Zhou, S. Zhang, C. Zheng, T. Li, Y. Hu, Q. Hao

TL;DR
This paper introduces a rapid digital refocusing method for Fourier ptychography microscopy that extends the depth of field and improves imaging speed by utilizing lateral shifts caused by defocusing and illumination angles.
Contribution
It presents a novel fast digital refocusing approach that accurately estimates defocus and extends the depth of field in FPM without time-consuming optimization.
Findings
Achieved high-resolution phase recovery with extended depth of field.
Demonstrated fast refocusing on biological samples and USAF chart.
Validated improved imaging speed and quality in experiments.
Abstract
Fourier ptychography microscopy (FPM), sharing its roots with synthetic aperture technique and phase retrieval method, is a recently developed computational microscopic super-resolution technique. By turning on the light-emitting diode (LED) elements sequentially and acquiring the corresponding images that contain different spatial frequencies, FPM can achieve a wide field-of-view (FOV), high-spatial-resolution imaging, and phase recovery simultaneously. Conventional FPM assumes that the sample is sufficiently thin and strictly in focus. Nevertheless, even for a relatively thin sample, the non-planar distribution characteristics and the non-ideal position/posture of the sample will cause all or part of FOV to be defocused. In this paper, we proposed a fast digital refocusing and depth-of-field (DOF) extended FPM strategy by taking the advantages of image lateral shift caused by sample…
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Taxonomy
TopicsAdvanced X-ray Imaging Techniques · Digital Holography and Microscopy · Advanced Electron Microscopy Techniques and Applications
