TL;DR
This paper demonstrates that using electron event representation (EER) data from high-speed direct electron detectors enables real-time, interactive 4D-STEM phase-contrast imaging, overcoming data handling challenges and enhancing analysis capabilities.
Contribution
The study introduces the use of linear-index encoded EER data from a high-speed detector for real-time 4D-STEM phase contrast imaging, improving computational efficiency and enabling interactive analysis.
Findings
EER data allows real-time phase-contrast imaging.
Computational steps optimized for hardware accelerators.
Experimental validation with 4D Camera data.
Abstract
The arrival of direct electron detectors (DED) with high frame-rates in the field of scanning transmission electron microscopy has enabled many experimental techniques that require collection of a full diffraction pattern at each scan position, a field which is subsumed under the name four dimensional-scanning transmission electron microscopy (4D-STEM). DED frame rates approaching 100 kHz require data transmission rates and data storage capabilities that exceed commonly available computing infrastructure. Current commercial DEDs allow the user to make compromises in pixel bit depth, detector binning or windowing to reduce the per-frame file size and allow higher frame rates. This change in detector specifications requires decisions to be made before data acquisition that may reduce or lose information that could have been advantageous during data analysis. The 4D Camera, a DED with 87…
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