Spinning Pupil Aberration Measurement for anisoplanatic deconvolution

TL;DR

This paper introduces a novel wavefront detector that measures aberrations across the entire field of view in a fluorescence microscope, enabling high-resolution, full-field correction through region-wise deconvolution.

Contribution

A new pupil sampling-based wavefront detector for full-field aberration measurement and anisoplanatic deconvolution in fluorescence microscopy.

Findings

Effective aberration measurement across the entire field of view.

Improved image reconstruction through region-wise deconvolution.

Potential for enhanced high-resolution imaging of large specimens.

Abstract

The aberrations in an optical microscope are commonly measured and corrected at one location in the field of view, within the so-called isoplanatic patch. Full-field correction is desirable for high-resolution imaging of large specimens. Here we present a novel wavefront detector, based on pupil sampling with sub-apertures, which measures the aberrated wavefront phase at each position of the specimen. Based on this measurement, we propose a region-wise deconvolution that provides an anisoplanatic reconstruction of the sample image. Our results indicate that the measurement and correction of the aberrations can be performed in a wide-field fluorescence microscope over its entire field of view.