Quantum-Probe Field Microscopy of Ultrafast Terahertz Excitations
Moritz B. Heindl, Nicholas Kirkwood, Tobias Lauster, Julia A. Lang,, Markus Retsch, Paul Mulvaney, Georg Herink

TL;DR
This paper introduces Quantum-probe Field Microscopy (QFIM), a novel far-field imaging technique using quantum-dot probes to visualize ultrafast Terahertz electric fields with sub-wavelength spatial and sub-picosecond temporal resolution.
Contribution
The work presents a new quantum-dot based microscopy method capable of capturing ultrafast electric fields in the Terahertz regime with high spatial and temporal resolution.
Findings
Successfully visualized localized Terahertz excitations
Achieved sub-wavelength spatial resolution
Demonstrated sub-picosecond temporal resolution
Abstract
Rapid evolutions of microscopic fields govern the majority of elementary excitations in condensed matter and drive microelectronic currents at increasing frequencies. Beyond nominal "radio frequencies", however, access to local electric waveforms remains a challenge. Several imaging schemes resolve sub-wavelength fields up to multi-Terahertz (THz) frequencies - including scanning-probe techniques, electro-optic sampling or recent ultrafast electron microscopy. Yet, various constraints on sample geometries, acquisition speed and maximum fields limit applications. Here, we introduce ubiquitous far-field microscopy of ultrafast local electric fields based on drop-cast quantum-dot probes. Our approach, termed Quantum-probe Field Microscopy (QFIM), combines fluorescence imaging of visible photons with phase-resolved sampling of electric fields deeply in the sub-wavelength regime. We capture…
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Taxonomy
TopicsTerahertz technology and applications · Semiconductor Quantum Structures and Devices · Photonic and Optical Devices
