The Validation of Graph Model-Based, Gate Level Low-Dimensional Feature Data for Machine Learning Applications
Aneesh Balakrishnan, Thomas Lange, Maximilien Glorieux, Dan, Alexandrescu, Maksim Jenihhin

TL;DR
This paper introduces a framework that models gate-level netlists as probabilistic graphs, extracting low-dimensional features for machine learning fault prediction, demonstrated on Ethernet circuit data.
Contribution
It presents a novel method to convert gate-level netlists into probabilistic graphs and uses these features with ML algorithms for fault analysis.
Findings
Support Vector Machine achieved high accuracy in fault prediction.
Deep Neural Networks outperformed traditional methods.
The framework effectively predicts fault propagation metrics.
Abstract
As an alternative to traditional fault injection-based methodologies and to explore the applicability of modern machine learning algorithms in the field of reliability engineering, this paper proposes a systemic framework that explores gate-level netlist circuit abstractions to extract and exploit relevant feature representations in a low-dimensional vector space. A scalable feature learning method on a graphical domain called node2vec algorithm had been utilized for efficiently extracting structural features of the netlist, providing a valuable database to exercise a selection of machine learning (ML) or deep learning (DL) algorithms aiming at predicting fault propagation metrics. The current work proposes to model the gate-level netlist as a Probabilistic Bayesian Graph (PGB) in the form of a Graph Modeling Language (GML) format. To accomplish this goal, a Verilog Procedural Interface…
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