Analyser-free, intensity-based wide-field magneto-optical microscopy
R. Sch\"afer, Peter M. Oppeneer, Alexey Ognev, Alexander Samardak, and, Ivan V. Soldatov

TL;DR
This paper introduces an analyser-free, intensity-based wide-field magneto-optical microscopy technique that utilizes various polarisation states and magneto-optical effects to image magnetic domains without traditional analyzers.
Contribution
The work demonstrates multiple novel analyser-free magneto-optical contrast mechanisms using intensity modulations, expanding the capabilities of magnetic domain imaging.
Findings
Transverse Kerr effect enables in-plane magnetisation imaging.
Circular polarisation reveals different domain contrast symmetries.
Perpendicular magnetisation can be imaged with circular polarisation.
Abstract
In conventional Kerr- and Faraday microscopy the sample is illuminated with plane-polarised light and a magnetic domain contrast is generated by an analyser making use of the Kerr- or Faraday rotation. In this paper we demonstrate possibilities of analyser-free magneto-optical microscopy based on magnetisation-dependent intensity modulations of the light: (i) The transverse Kerr effect can be applied for in-plane magnetised material, demonstrated for an FeSi sheet. (ii) Illuminating the same sample with circularly polarised light leads to a domain contrast with a different symmetry as the conventional Kerr contrast. (iii) Circular polarisation can also be used for perpendicularly magnetised material, demonstrated for a garnet film and an ultrathin CoFeB film. (iv) Plane-polarised light at a specific angle can be employed for both, in-plane and perpendicular media. (v) Perpendicular…
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