An alternative method of image simulation in high resolution transmission electron microscopy

TL;DR

This paper introduces a new image simulation method for high resolution transmission electron microscopy that models atom centers as electrostatic interferometers, showing good agreement with experimental images.

Contribution

The paper presents an alternative simulation approach based on electrostatic interferometry, differing from traditional methods, validated against experimental data.

Findings

Simulation results match experimental images of MoS2 and BN

Good agreement under specific aberration and defocus conditions

Proposes a novel conceptual model for image simulation

Abstract

An alternative approach to the image simulation in high resolution transmission electron microscopy (HRTEM) is introduced after comparative analysis of the existing image simulation methods. The alternative method is based on considering the atom center as an electrostatic interferometer akin to the conventional off-axis electron biprism within few nanometers of focus variation. Simulation results are compared with the experimental images of 2D materials of MoS2, BN recorded under the optimum combination of third order spherical aberration (Cs)= -35 micrometers and defocus = 1, 4, and 8 nm and are found to be in good agreement.