Characterization of silicon microstrip sensors for space astronomy

TL;DR

This paper thoroughly characterizes silicon microstrip sensors used in space astronomy, focusing on electrical parameters crucial for sensor performance and reliability.

Contribution

It introduces precise measurement methods for key sensor parameters and validates them through SPICE modeling and analysis.

Findings

Accurate measurement of leakage currents using two methods

Effective extraction of coupling capacitance via SPICE and two-port analysis

Derived expression for bias resistance based on SPICE model

Abstract

Silicon microstrip detectors are widely used in experiments for space astronomy. Before the detector is assembled, extensive characterization of the silicon microstrip sensors is indispensable and challenging. This work electrically evaluates a series of sensor parameters, including the depletion voltage, bias resistance, metal strip resistance, total leakage current, strip leakage current, coupling capacitance, and interstrip capacitance. Two methods are used to accurately measure the strip leakage current, and the test results match each other well. In measuring the coupling capacitance, we extract the correct value based on a SPICE model and two-port network analysis. In addition, the expression of the measured bias resistance is deduced based on the SPICE model.