Capacitive imaging using fused amplitude and phase information for improved defect detection
Silvio Amato, David Hutchins, Xiaokang Yin, Marco Ricci, Stefano, Laureti

TL;DR
This paper presents a novel capacitive imaging method that fuses amplitude and phase data to enhance defect detection and characterization in non-destructive evaluation, outperforming traditional amplitude-only approaches.
Contribution
It introduces a new image processing technique that combines amplitude and phase information for improved defect detection in capacitive imaging.
Findings
Enhanced defect detection accuracy demonstrated on benchmark samples.
Improved image clarity and defect characterization shown on composite samples.
Method outperforms traditional amplitude-only imaging approaches.
Abstract
This paper introduces an improved image processing method usable in capacitive imaging applications. Standard capacitive imaging tends to prefer amplitude-based images over the use of phase due to better signal-to-noise ratios. The new approach exploits the best features of both types of information by combining them to form clearer images, hence improving both defect detection and characterization in non-destructive evaluation. The methodology is demonstrated and optimized using a benchmark sample. Additional experiments on glass fibre composite sample illustrate the advantages of the technique.
Peer Reviews
No public reviews on file for this paper yet. If you reviewed it on a platform where reviews are public (OpenReview, ICLR, NeurIPS, ICML), you can paste yours below so the community can read it here.
Videos
No videos yet. Explain this paper in a talk, walkthrough, or lecture? Add one.
