A novel measurement approach for near-edge x-ray absorption fine structure: continuous 2$\pi$ angular rotation of linear polarization

TL;DR

This paper introduces a new method for NEXAFS spectroscopy using continuous 2π rotation of polarized light, enabling detailed polarization analysis of molecular orbitals in nano-scale and operando conditions.

Contribution

A novel measurement technique employing continuous 2π angular rotation of linear polarization for enhanced NEXAFS spectroscopy.

Findings

Successful demonstration with a 2D film showing polarization-dependent intensity.

Method offers technical advantages for nano-space and operando experiments.

Compatible with state-of-the-art soft x-ray spectroscopy setups.

Abstract

A new technical method is developed for soft x-ray spectroscopy of near-edge x-ray absorption fine structure (NEXAFS). The measurement is performed with continuously rotating linearly polarized light over 2$\pi$, generated by a segmented undulator. A demonstration of the rotational NEXAFS experiment was successfully made with a 2D film, showing detailed polarization-dependence in intensity of the molecular orbitals. The present approach provides varieties of technical opportunities that are compatible with the state-of-the-art experiments in nano-space and under the $operando$ condition.