Sensitivity of Standard Library Cells to Optical Fault Injection Attacks in IHP 250 nm Technology

TL;DR

This paper investigates how standard library cells in IHP 250 nm technology are vulnerable to optical fault injection attacks, analyzing the impact of attacker-configured parameters on attack success.

Contribution

It provides an experimental analysis of optical fault injection effects on various standard library gates in IHP 250 nm technology.

Findings

Successful optical fault injections into INV, NAND, NOR, and FF gates.

Parameter settings significantly influence attack success.

Highlights vulnerabilities in standard library cells to optical fault attacks.

Abstract

The IoT consists of a lot of devices such as embedded systems, wireless sensor nodes (WSNs), control systems, etc. It is essential for some of these devices to protect information that they process and transmit. The issue is that an adversary may steal these devices to gain a physical access to the device. There is a variety of ways that allows to reveal cryptographic keys. One of them are optical Fault Injection attacks. We performed successful optical Fault Injections into different type of gates, in particular INV, NAND, NOR, FF. In our work we concentrate on the selection of the parameters configured by an attacker and their influence on the success of the Fault Injections.