A hole spin qubit in a fin field-effect transistor above 4 kelvin
Leon C. Camenzind, Simon Geyer, Andreas Fuhrer, Richard J. Warburton,, Dominik M. Zumb\"uhl, Andreas V. Kuhlmann

TL;DR
This paper demonstrates silicon FinFET-based hole spin qubits operating above 4K, with high control fidelity and fast manipulation, paving the way for scalable quantum computing integrated with classical electronics.
Contribution
It introduces silicon FinFETs as viable hosts for high-temperature spin qubits, achieving operation above 4K with industry-compatible fabrication.
Findings
Spin qubits operate above 4K in silicon FinFETs
Single-qubit gate fidelities reach fault-tolerance thresholds
Fast electrical control with up to 150MHz driving frequency
Abstract
The greatest challenge in quantum computing is achieving scalability. Classical computing previously faced a scalability issue, solved with silicon chips hosting billions of fin field-effect transistors (FinFETs). These FinFET devices are small enough for quantum applications: at low temperatures, an electron or hole trapped under the gate serves as a spin qubit. Such an approach potentially allows the quantum hardware and its classical control electronics to be integrated on the same chip. However, this requires qubit operation at temperatures above 1K, where the cooling overcomes heat dissipation. Here, we show that silicon FinFETs can host spin qubits operating above 4K. We achieve fast electrical control of hole spins with driving frequencies up to 150MHz, single-qubit gate fidelities at the fault-tolerance threshold, and a Rabi oscillation quality factor greater than 87. Our…
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