Partial Meissner effect measurement by a superconducting magnetic flux lens
A. Ivanov, T. Koettig, A. Macpherson

TL;DR
This study introduces a new method to measure flux expulsion in superconducting materials using a superconducting magnetic flux lens, revealing how cooling dynamics influence flux trapping and expulsion.
Contribution
The paper presents an alternative experimental setup for quantifying flux expulsion in superconducting samples, independent of cavity-specific cool down conditions.
Findings
Flux expulsion correlates with cooling rate and superconducting front velocity.
Expulsion improves with larger spatial temperature gradients.
Method allows material qualification before cavity fabrication.
Abstract
Magnetic flux trapping in the Meissner transition of superconducting radio frequency cavities can substantially increase dissipation which impacts cryogenic costs and necessitates expensive magnetic shielding. Recent findings point at the material preparation and the cool down dynamics at the vortex state as the main ways to counteract flux trapping. Most of the related measurements are performed on the cavity, with risk of results being impacted by the cool down specifics of each facility. We demonstrate an alternative experiment in which flux expulsion is quantified from sheet material, with samples conduction cooled in a stand-alone instrument designed to collimate expelled flux at controlled cool down conditions. A series of tests reliably and reproducibly relate the amount of expelled flux to the cooling rate, the velocity of the superconducting front and the spatial temperature…
Peer Reviews
No public reviews on file for this paper yet. If you reviewed it on a platform where reviews are public (OpenReview, ICLR, NeurIPS, ICML), you can paste yours below so the community can read it here.
Videos
No videos yet. Explain this paper in a talk, walkthrough, or lecture? Add one.
Taxonomy
TopicsPhysics of Superconductivity and Magnetism · Magnetic properties of thin films · Magneto-Optical Properties and Applications
