Data-driven sensitivity analysis in a total-reflection high-energy positron diffraction (TRHEPD) experiment of the Si$_4$O$_5$N$_3$ / 6H-SiC (0001)-($\sqrt{3} \times \sqrt{3}$) R30$^\circ$
Takeo Hoshi, Daishiro Sakata, Shotaro Oie, Izumi Mochizuki, Satoru, Tanaka, Toshio Hyodo, Koji Hukushima

TL;DR
This paper introduces a data analysis method combining auto-optimization and sensitivity analysis for TRHEPD experiments, improving reliability in surface structure determination of Si$_4$O$_5$N$_3$ / 6H-SiC(0001).
Contribution
It presents a novel data analysis approach that enhances the interpretation of TRHEPD measurements through numerical solutions and sensitivity assessment, applicable to various surface science experiments.
Findings
Effective structure determination of Si$_4$O$_5$N$_3$ / 6H-SiC surface.
Sensitivity analysis guides variable selection for reliable data interpretation.
Method reduces computational time using parallel supercomputing.
Abstract
The present article proposes a data analysis method for experimentally-derived measurements, which consists of an auto-optimization procedure and a sensitivity analysis. The method was applied to the results of a total-reflection high-energy positron diffraction (TRHEPD) experiment, a novel technique of determining surface structures or the position of the atoms near the material surface. This method solves numerically the partial differential equation in the fully-dynamical quantum diffraction theory with many trial surface structures. In the sensitivity analysis, we focused on the experimental uncertainties and the variation over individual fitting parameters, which was analyzed by solving the eigenvalue problem of the variance-covariance matrix. A modern massively parallel supercomputer was used to complete the analysis within a moderate computational time. The sensitivity analysis…
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Taxonomy
TopicsMuon and positron interactions and applications · X-ray Diffraction in Crystallography · Electron and X-Ray Spectroscopy Techniques
